This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

Keyword Search

Keyword Search Criteria: Process Control returned 9 record(s)
Sunday, 08/01/2010
Process Capability Analysis Chart for a Product with Bilateral Specifications
Jose Alberto Vargas, Universidad Nacional de Colombia; Ruben D. Guevara, Universidad Nacional de Colombia
4:50 PM

Monday, 08/02/2010
The Use of Paradata to Monitor and Manage Survey Data Collection
Mick Couper, University of Michigan; Frauke Kreuter, University of Maryland; Lars Lyberg, Statistics Sweden
10:35 AM

Monitoring Profile Based on a Linear Regression Model with Correlated Errors
Tsung-Chi Cheng, National Chengchi University; Su-Fen Yang, National Chengchi University
10:35 AM

A Robust-Likelihood Cummulative Sum Chart
Youlan Rao, Millennium Pharmaceuticals, Inc.; Steven MacEachern, The Ohio State University; Chunjie Wu, Shanghai University of Finance and Economics
11:20 AM

Tuesday, 08/03/2010
Nonparametric Profile Monitoring by Mixed Effects Modeling
Peihua Qiu, University of Minnesota
2:05 PM

Wednesday, 08/04/2010
A Practical Approach for Removing Multiple Outliers Using the T-Square Statistic
John C. Young, Retired; Robert L. Mason, Southwest Research Institute; Youn-Min Amanda Chou, The University of Texas at San Antonio


A GLR Control Chart for Monitoring a Proportion
Wandi Huang, Virginia Tech


A Nonparametric Change Point Model for Multivariate Phase II Statistical Process Control
Mark David Holland, University of Minnesota; Douglas Hawkins, University of Minnesota
8:35 AM

Use of CUSUM Control Charts When Population Size Changes Over Time
J. Brooke Marshall, Merck Research Laboratories; Dan J. Spitzner, University of Virginia
9:20 AM




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